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Tabletop Scanning Electron Microscope

Maximize user convenience in a high-resolution tabletop SEM


A software update adds five convenient automated functions, making analysis easy for anyone. Usability has been expanded with particle size analysis and 3D rendering capabilities.
Furthermore, faster vacuum speeds enable rapid sample analysis, delivering maximum performance in the same time.

Dimensions have been reduced by more than 40%, enabling tabletop SEM installation even in confined spaces.

 


Experience the highest magnification in its class, 250,000x, with 5nm resolution. 

Precise
lens control allows you to capture optimal images without damaging your sample.


5-axis motorized system
The 5-axis motorized system with a precision of approximately 5um allows you to find the sample position faster and more accurately.

 

Faster sample preparation time

 

Compact design
The compact design minimizes installation space.
Dimensions are reduced by 40% compared to the existing model
The efficient structure minimizes installation space, allowing installation even in narrow laboratories.
300(W) x 465(D) x 600(H)

 

A new, third generation Nano-Eye

A Groundbreakingly Improved Interface
◊ Set up your shooting environment more easily with the newly applied UI.
◊ Optimized accessibility allows you to see results 60% faster than previous software
◊ Provides a larger screen and user-friendly interface.

 

Enhanced Auto Features
Easily prepare your shots with the newly added Auto gun align feature.
Improved Auto Focus makes it even easier to capture the desired image.

Large Area Scanning:
Capture a wider area.
The large area scanning feature is essential for imaging and analyzing large specimens.
Specify a larger area of ​​your sample than can be captured in a single SEM image.
The large area scanning feature automatically acquires images from multiple locations within a specified area,
enabling both large-area and high-resolution analysis at any desired magnification.

 

3D Rendering
Easily and conveniently check the three-dimensional roughness of the sample surface with the newly-equipped 3D rendering function.

Specifications:

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